MAX785中文资料Product Reliability Report数据手册ADI规格书

描述 Description

This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1996. It is separated into seven fabrication processes: 1) Standard Metal-Gate CMOS (SMG); 2) Medium-Voltage Metal-Gate CMOS (MV1); 3) Medium-Voltage Silicon-Gate CMOS (MV2); 4) 3µm Silicon-Gate CMOS (SG3); 5) 5µm Silicon Gate CMOS (SG5); 6) 1.2µm Silicon-Gate CMOS; and 7) Bipolar (BIP) processes.
Over 8,967,000 device hours have been accumulated for products stressed at an elevated temperature (135°C) during this period. The data in this report is considered typical of Maxim’s production. As you will see, Maxim’s products demonstrate consistently high reliability.