首页>M39003SLASH09-2085ESLASHWR>规格书详情
M39003SLASH09-2085ESLASHWR中文资料威世科技数据手册PDF规格书
相关芯片规格书
更多M39003SLASH09-2085ESLASHWR规格书详情
• Hermetically sealed
• Metal cased
• Axial lead
• Weibull failure rates B, C, D
• Exponential failure rates M, P, R, S
• Low ESR
• 100 % surge current test
• Tape and reel available per EIA-296 standard