丝印：LX8T245H；Package：VQFN(RHL)；SN74LXCH8T245 8-bit Translating Transceiver with Configurable Level Shifting

1 Features • Fully Configurable Dual-Rail Design Allows Each Port to Operate from 1.1 V to 5.5 V • Robust, Glitch-Free Power Supply Sequencing • Up to 420-Mbps Support for 3.3 V to 5.0 V • Bus Hold on Data Inputs Eliminates the Need for External Pull-Up and Pull-Down Resistors • Schmitt-Tri

文件：1.78218 Mbytes 页数：37 Pages

TI

德州仪器

丝印：LX8T245H；Package：VQFN(RHL)；SN74LXCH8T245 8-bit Translating Transceiver with Configurable Level Shifting

1 Features • Fully Configurable Dual-Rail Design Allows Each Port to Operate from 1.1 V to 5.5 V • Robust, Glitch-Free Power Supply Sequencing • Up to 420-Mbps Support for 3.3 V to 5.0 V • Bus Hold on Data Inputs Eliminates the Need for External Pull-Up and Pull-Down Resistors • Schmitt-Tri

文件：1.78218 Mbytes 页数：37 Pages

TI

德州仪器

丝印：LX8T245Q；Package：VQFN；SN74LXC8T245-Q1 Automotive 8-bit Dual-Supply Bus Transceiver with Configurable Level Shifting and 3-State Outputs

1 Features • AEC-Q100 qualified for automotive applications • Fully configurable dual-rail design allows each port to operate from 1.1 V to 5.5 V • Robust, glitch-free power supply sequencing • Up to 420-Mbps support for 3.3 V to 5.0 V • Schmitt-trigger inputs allow for slow or noisy inputs

文件：1.39915 Mbytes 页数：36 Pages

TI

德州仪器

丝印：LX8996；Package：TSSOP(PW)；3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

文件：910.64 Kbytes 页数：50 Pages

TI

德州仪器

丝印：LX8996；Package：TSSOP(PW)；3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

文件：910.64 Kbytes 页数：50 Pages

TI

德州仪器

丝印：LX8996；Package：TSSOP(PW)；3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

文件：910.64 Kbytes 页数：50 Pages

TI

德州仪器

丝印：LX8T245；Package：TSSOP(PW)；SN74LXC8T245 8-bit Dual-Supply Bus Transceiver with Configurable Level Shifting and 3-State Outputs

1 Features • Fully configurable dual-rail design allows each port to operate from 1.1 V to 5.5 V • Robust, glitch-free power supply sequencing • Up to 420-Mbps support for 3.3 V to 5.0 V • Schmitt-trigger inputs allow for slow or noisy inputs • I/Os with integrated dynamic pull-down resistor

文件：1.6406 Mbytes 页数：36 Pages

TI

德州仪器

丝印：LX8T245；Package：TSSOP；SN74LXC8T245 8-bit Dual-Supply Bus Transceiver with Configurable Level Shifting and 3-State Outputs

1 Features • Fully configurable dual-rail design allows each port to operate from 1.1 V to 5.5 V • Robust, glitch-free power supply sequencing • Up to 420-Mbps support for 3.3 V to 5.0 V • Schmitt-trigger inputs allow for slow or noisy inputs • I/Os with integrated dynamic pull-down resistor

文件：1.4131 Mbytes 页数：36 Pages

TI

德州仪器

丝印：LX8T245；Package：TSSOP(PW)；SN74LXC8T245 8-bit Dual-Supply Bus Transceiver with Configurable Level Shifting and 3-State Outputs

1 Features • Fully configurable dual-rail design allows each port to operate from 1.1 V to 5.5 V • Robust, glitch-free power supply sequencing • Up to 420-Mbps support for 3.3 V to 5.0 V • Schmitt-trigger inputs allow for slow or noisy inputs • I/Os with integrated dynamic pull-down resistor

文件：1.6406 Mbytes 页数：36 Pages

TI

德州仪器

丝印：LX8T245；Package：TSSOP(PW)；SN74LXC8T245 8-bit Dual-Supply Bus Transceiver with Configurable Level Shifting and 3-State Outputs

1 Features • Fully configurable dual-rail design allows each port to operate from 1.1 V to 5.5 V • Robust, glitch-free power supply sequencing • Up to 420-Mbps support for 3.3 V to 5.0 V • Schmitt-trigger inputs allow for slow or noisy inputs • I/Os with integrated dynamic pull-down resistor

文件：1.6406 Mbytes 页数：36 Pages

TI

德州仪器