ISL73023SEHLSLASHPROTO中文资料瑞萨数据手册PDF规格书

Features

▪ Very low rDS(ON) 5mΩ (typical)

▪ Ultra low total gate charge 14nC (typical)

▪ SEE hardness (see SEE report for details)

• SEL/SEB LETTH (VDS = 100V, VGS = 0V):

86MeV•cm2/mg(Si)

▪ ISL70023SEH radiation accepting testing

• High dose rate (50-300rad(Si)/s): 100krad(Si)

• Low dose rate (0.01rad(Si)/s): 75krad(Si)

▪ ISL73023SEH radiation accepting testing

• Low dose rate (0.01rad(Si)/s): 75krad(Si)

▪ Ultra small hermetically sealed 4 Ld Surface Mount

Device (SMD) package

• Package area: 42mm2

▪ Full military-temperature range operation

• TA = -55°C to +125°C

• TJ = -55°C to +150°C

▪ Qualified to Renesas Rad Hard GaN FET

Screening and QCI Flow (R34TB0003EU)

• All screening and QCI is in accordance with

MIL-PRF-38535L Class-V