ISL28633EV2Z开发板套件编程器的评估板-运算放大器规格书PDF中文资料

The ISL28533, ISL28534, ISL28535, ISL28633, ISL28634,

and ISL28635 are 5V Zero-Drift Rail-to-Rail Input/Output

Programmable Gain Instrumentation Amplifiers (PGIA). These

instrumentation amplifiers feature low offset, low noise, low

gain error and high CMRR. They are ideal for high precision

applications over the wide industrial temperature range.

These Instrumentation Amplifiers are designed with a unique

2-bit, 3-state logic interface that allows up to 9 selectable gain

settings. The ISL2853x single-ended output includes and

additional uncommitted zero-drift amplifier, useful to buffer

the REF input or used as a precision amplifier. The ISL2863x

differential output amplifier includes a reference pin to set the

common mode output voltage to interface with differential

input ADCs.

Features

• Ultra high precision front end amplifier

• Zero drift instrumentation amplifier

• Pin selectable 9 gain settings: G = 1 to 1,000

• Rail-to-Rail input/output

• Single ended output (ISL28533, ISL28534, ISL28535)

• Differential output (ISL28633, ISL28634, ISL28635)

• RFI filtered inputs improve EMI rejection

• Single supply . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.5V to 5.5V

• Dual supply . . . . . . . . . . . . . . . . . . . . . . . . . ±1.25V to ±2.75V

• Low input offset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5µV, Max

• Low input offset drift . . . . . . . . . . . . . . . . . . . . . 50nV/°C, Max

• High CMRR . . . . . . . . . . . . . . . . . . . . . . . . . . . . 138dB, G = 100

• Low gain error. . . . . . . . . . . . . . . . . . . . . <0.4, All Gains, Max

• Gain bandwidth . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.3MHz

• Input voltage noise (0.1Hz to 10Hz). . . . . . . . . . . . . . 0.4µVP-P

• Operating temperature range. . . . . . . . . . . .-40°C to +125°C

Applications

• Pressure and strain gauge transducers

• Weight scales

• Flow sensors

• Biometric: ECG/blood glucose

• Temperature sensors

• Test and measurement

• Data acquisition systems

• Low ohmic current sense