HEF4094BT-Q100数据手册集成电路（IC）的移位寄存器规格书PDF

描述 Description

The HEF4094B-Q100 is an 8-stage serial shift register. It has a storage latch associated with each stage for strobing data from the serial input to parallel buffered 3-state outputs QP0 to QP7. The parallel outputs may be connected directly to common bus lines. Data is shifted on positive-going clock transitions. The data in each shift register stage is transferred to the storage register when the strobe (STR) input is HIGH. Data in the storage register appears at the outputs whenever the output enable (OE) signal is HIGH.
Two serial outputs (QS1 and QS2) are available for cascading a number of HEF4094B-Q100 devices. Serial data is available at QS1 on positive-going clock edges to allow high-speed operation in cascaded systems with a fast clock rise time. The same serial data is available at QS2 on the next negative going clock edge. This is used for cascading HEF4094B-Q100 devices when the clock has a slow rise time.
It operates over a recommended VDD power supply range of 3 V to 15 V referenced to VSS (usually ground). Connect unused inputs to VDD, VSS, or another input.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.

特性 Features

• Automotive product qualification in accordance with AEC-Q100 (Grade 1)
• Specified from -40 °C to +85 °C and from -40 °C to +125 °C

• Fully static operation
• 5 V, 10 V, and 15 V parametric ratings
• Standardized symmetrical output characteristics
• ESD protection:
• MIL-STD-833, method 3015 exceeds 2000 V
• HBM JESD22-A114F exceeds 2000 V
• MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 Ω)

• Complies with JEDEC standard JESD 13-B