HCTS374T中文资料Intersil数据手册PDF规格书

Radiation Hardened Octal D-Type Flip-Flop, Three-State, Positive Edge Triggered

Intersil’s Satellite Applications FlowTM (SAF) devices are fully tested and guaranteed to 100kRAD total dose. These QML Class T devices are processed to a standard flow intended to meet the cost and shorter lead-time needs of large volume satellite manufacturers, while maintaining a high level of reliability.

特性 Features

• QML Class T, Per MIL-PRF-38535

• Radiation Performance

    - Gamma Dose (γ) 1 x 105 RAD(Si)

    - Latch-Up Free Under Any Conditions

    - SEP Effective LET No Upsets: >100 MEV-cm2/mg

    - Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day (Typ)

• 3 Micron Radiation Hardened SOS CMOS

• Fanout (Over Temperature Range)

    - Bus Driver Outputs - 15 LSTTL Loads

• Significant Power Reduction Compared to LSTTL ICs

• DC Operating Voltage Range: 4.5V to 5.5V

• LSTTL Input Compatibility

    - VIL = 0.8V Max

    - VIH = VCC/2 Min

• Input Current Levels Ii ≤ 5mA at VOL, VOH