HCTS20KMSR中文资料INTERSIL数据手册PDF规格书

Description

The Intersil HCTS20MS is a Radiation Hardened Dual 4-Input NAND Gate. A low on any input forces the output to a High state.

The HCTS20MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family.

The HCTS20MS is supplied in a 14 lead Ceramic flatpack (K suffix) or a SBDIP Package (D suffix).

Features

• 3 Micron Radiation Hardened SOS CMOS

• Total Dose 200K RAD (Si)

• SEP Effective LET No Upsets: >100 MEV-cm2/mg

• Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day (Typ)

• Dose Rate Survivability: >1 x 1012 RAD (Si)/s

• Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse

• Latch-Up Free Under Any Conditions

• Military Temperature Range: -55°C to +125°C

• Significant Power Reduction Compared to LSTTL ICs

• DC Operating Voltage Range: 4.5V to 5.5V

• LSTTL Input Compatibility

- VIL = 0.8V Max

- VIH = VCC/2 Min

• Input Current Levels Ii ≤ 5µA at VOL, VOH