EVAL-ADUM4137EBZ开发板套件编程器的评估演示板及套件规格书PDF中文资料

EVAL-ADUM4137EBZ属于开发板套件编程器的评估演示板及套件。由亚德诺半导体技术有限公司制造生产的EVAL-ADUM4137EBZ评估和演示板及套件该系列产品提供了一种方便的方法，在经过验证的实施环境中评估某些重点器件的性能或特性。评估方法通常有完善的文档说明，并且视乎具体情况由评估软件提供支持。产品通常由印刷电路板组成，板上已装有重点器件以及必要或有用的支持元器件，另外也可能包括其他组件，例如电缆或电源。对于数量特别多或类别独特的器件类别(如 ADC、DAC 和开关模式电源)，评估平台可组合为一个单独的产品系列。

GENERAL DESCRIPTION

The ADuM41371 is a single-channel gate driver specifically optimized for driving insulated gate bipolar transistors (IGBTs). Analog Devices, Inc., iCoupler® technology provides isolation between the input signal and the output gate drive.

The Analog Devices chip scale transformers also provide isolated communication of control information between the high voltage and low voltage domains of the chip. Information on the status of the chip can be read back from the dedicated fault outputs. The ADuM4137 provides isolated fault reporting for overcurrent events, remote temperature overheating events, undervoltage lockout (UVLO), and thermal shutdown (TSD). Integrated onto the ADuM4137 is an overcurrent detection feature that protects the IGBT in case of overcurrent events. The split emitter overcurrent detection is coupled with a high speed, two-level turn off in case of faults.

The ADuM4137 provides a Miller clamp control signal for the external metal-oxide semiconductor field effect transistor (MOSFET) to provide robust IGBT turn off with a single rail supply when the gate voltage drops below 2.0 V (typical) and above GND2. Operation with unipolar secondary supplies is possible, with or without the Miller clamp operation.

A low gate voltage detection circuit can trigger a fault if the gate voltage does not go above the internal threshold (VVL) within the time allowed from turn on (tDVL). This circuit allows detection of IGBT device failures that exhibit gate shorts or other causes of weak drive.

The secondary falling UVLO is set to 11.24 V (typical) for common IGBT two-level plateau voltage levels.

The ADuM4137 provides for in field programming of temperature. Two temperature sensor pins allow isolated monitoring of system temperatures at the IGBTs, sensing diode gains and offsets by means of a serial port interface (SPI) bus on the primary side of the device. Values are stored on an EEPROM located on the secondary side. Additionally, programming is available for specific voltage offsets, temperature sensing reporting frequencies, and important delays.

The ASC pin on the secondary side on the ADuM4137 allows the driver to be switched on from the secondary side if no faults are present.

FEATURES

6 A peak drive output capability

Internal turn off NFET, on resistance: <0.95 Ω

Internal turn on PFET, on resistance: <1.18 Ω

Split emitter overcurrent detection

Miller clamp output with gate sense input

Isolated fault output

Isolated temperature sensor read back

Propagation delay

Rising: 105 ns typical

Falling: 107 ns typical

Minimum pulse width: 70 ns

Operating junction temperature range (−40°C to +150°C)

VDD1 and VDD2 UVLO

ASC input

8.3 mm creepage distance

Safety and regulatory approvals

5 kV rms for 1 minute per UL 1577

CSA Component Acceptance Notice 5A

DIN V VDE V 0884-10 (VDE V 0884-10):2006-12

VIORM = 849 VPEAK (reinforced/basic)

AEC-Q100 qualified for automotive applications