DS2174Q集成电路（IC）的电信规格书PDF中文资料

DESCRIPTION

The DS2174 enhanced bit error rate tester (EBERT) is a software-programmable test-pattern generator, receiver, and analyzer capable of meeting the most stringent error-performance requirements of digital transmission facilities. It features bit-serial, nibble-parallel, and byte-parallel data interfaces, and generates and uniquely synchronizes to pseudorandom patterns of the form 2n - 1, where n can take on values from 1 to 32, and user-defined repetitive patterns of any length up to 512 octets.

FEATURES

■ Generates and detects digital patterns for analyzing and trouble-shooting digital communications systems

■ Programmable polynomial length and feedback taps for generation of any pseudorandom patterns up to 232 - 1; up to 32 taps can be used in the feedback path

■ Programmable, user-defined pattern registers for long repetitive patterns up to 512 bytes in length

■ Large 48-bit count and bit error count registers

■ Software-programmable bit error insertion

■ Fully independent transmit and receive paths

■ 8-bit parallel-control port

■ Detects polynomial test patterns in the presence of bit error rates up to 10-2

■ Programmable for serial, 4-bit parallel, or 8-bit parallel data interfaces

■ Serial mode clock rate is 155MHz; byte mode is 80MHz for a net 622Mbps; OC-3

■ Available in 44-pin PLCC

APPLICATIONS

■ Routers

■ Channel Service Units (CSUs)

■ Data Service Units (DSUs)

■ Muxes

■ Switches

■ Digital-to-Analog Converters (DACs)

■ CPE Equipment

■ Bridges

■ Smart Jack