CD4023BMS数据手册Renesas中文资料规格书

描述 Description

CD4011BMS - Quad 2 Input CD4012BMS - Dual 4 Input CD4023BMS - Triple 3 Input
CD4011BMS, CD4012BMS, and CD4023BMS NAND gates provide the system designer with direct implementation of the NAND function and supplement the existing family of CMOS gates. All inputs and outputs are buffered.
The CD4011BMS, CD4012BMS and the CD4023BMS is supplied in these 14 lead outline packages: CD4011B CD4012B CD4023B Braze Seal DIP H4Q H4H H4Q Frit Seal DIP H1B H1B H1B Ceramic Flatpack H3W H3W H3W

特性 Features

• High-Voltage Types (20V Rating)
• Propagation Delay Time = 60ns (typ.) at CL = 50pF, VDD = 10V
• Buffered Inputs and Outputs
• Standardized Symmetrical Output Characteristics
• Maximum Input Current of 1µA at 18V Over Full Package- Temperature Range; 100nA at 18V and +25oC
• 100% Tested for Maximum Quiescent Current at 20V
• 5V, 10V and 15V Parametric Ratings
• Noise Margin (Over Full Package Temperature Range):
• 1V at VDD = 5V
• 2V at VDD = 10V
• 2.5V at VDD = 15V
• Meets All Requirements of JEDEC Tentative Standards No. 13B, \"Standard Specifications for Description of \"B\" Series CMOS Device's