丝印：CAH；Package：5LdSC-70；Low Noise LDO with Low IQ And High PSRR

ISL9003 is a high performance single low noise, high PSRR LDO that delivers a continuous 150mA of load current. It has a low standby current and is stable with 1µF of MLCC output capacitance with an ESR of up to 200mΩ. The ISL9003 has a very high PSRR of 90dB and output noise is 20µVRMS (typi

文件：186.67 Kbytes 页数：10 Pages

Intersil

丝印：CGC；Package：SC70；SN74AHC1G02B-EP Enhanced Product, Single 2-Input Positive-NOR Gate

1 Features • Operating range 2V to 5.5V VCC • Low delay, 4.3ns typ. (25°C, 5V) • Latch-up performance exceeds 250mA per JESD 17 • Supports defense and aerospace applications: – Controlled baseline – One assembly and test site – One fabrication site – Extended product life cycle – Product

文件：934.54 Kbytes 页数：24 Pages

TI

德州仪器

丝印：39IH；Package：SOT-23；SN74AHC1G125-Q1 Automotive Single Bus Buffer Gate With 3-State Output

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Operating range of 2-V to 5.5-V • Low power consumption, 10-μA maximum ICC • ±8-mA output drive at 5

文件：1.21582 Mbytes 页数：25 Pages

TI

德州仪器

丝印：1PQ；Package：SC70；SN74AHC1G125-Q1 Automotive Single Bus Buffer Gate With 3-State Output

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Operating range of 2-V to 5.5-V • Low power consumption, 10-μA maximum ICC • ±8-mA output drive at 5

文件：1.029579 Mbytes 页数：22 Pages

TI

德州仪器

丝印：1PQ；Package：SC70；SN74AHC1G125-Q1 Automotive Single Bus Buffer Gate With 3-State Output

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Operating range of 2-V to 5.5-V • Low power consumption, 10-μA maximum ICC • ±8-mA output drive at 5

文件：1.21582 Mbytes 页数：25 Pages

TI

德州仪器

丝印：39NH；Package：SOT-23；SN74AHC1G126-Q1 Automotive Single Bus Buffer Gate With 3-State Output

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Operating range of 2-V to 5.5-V • Low power consumption, 10-μA maximum ICC • ±8-mA output drive at 5

文件：1.17793 Mbytes 页数：25 Pages

TI

德州仪器

丝印：1QI；Package：SC70；SN74AHC1G126-Q1 Automotive Single Bus Buffer Gate With 3-State Output

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Operating range of 2-V to 5.5-V • Low power consumption, 10-μA maximum ICC • ±8-mA output drive at 5

文件：969.55 Kbytes 页数：21 Pages

TI

德州仪器

丝印：1QI；Package：SC70；SN74AHC1G126-Q1 Automotive Single Bus Buffer Gate With 3-State Output

1 Features • AEC-Q100 qualified for automotive applications: – Device temperature grade 1: -40°C to +125°C – Device HBM ESD classification level 2 – Device CDM ESD classification level C4B • Operating range of 2-V to 5.5-V • Low power consumption, 10-μA maximum ICC • ±8-mA output drive at 5

文件：1.17793 Mbytes 页数：25 Pages

TI

德州仪器

丝印：CGB；Package：SC70；SN74AHC1G86B-EP Enhanced Product, Single 2-Input Exclusive-OR Gate

1 Features • Operating range 2V to 5.5V VCC • Low delay, 4.3ns typ. (25°C, 5V) • Latch-up performance exceeds 250mA per JESD 17 • Supports defense and aerospace applications: – Controlled baseline – One assembly and test site – One fabrication site – Extended product life cycle – Product

文件：1.03849 Mbytes 页数：24 Pages

TI

德州仪器

丝印：CGB；Package：SC70；SN74AHC1G86B-EP Enhanced Product, Single 2-Input Exclusive-OR Gate

1 Features • Operating range 2V to 5.5V VCC • Low delay, 4.3ns typ. (25°C, 5V) • Latch-up performance exceeds 250mA per JESD 17 • Supports defense and aerospace applications: – Controlled baseline – One assembly and test site – One fabrication site – Extended product life cycle – Product

文件：1.0758 Mbytes 页数：26 Pages

TI

德州仪器