INFRARED IC INTERNAL INSPECTION SYSTEM

The C2955 is an IC internal inspection system incorporating an infrared microscope and an infrared CCD camera. Use of a newly developed infrared CCD camera enables a high sensitivity approximately ten times that of conventional systems (in comparisons by HAMAMATSU), at a wavelength of 1.0 µm, maki

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HAMAMATSUHamamatsu Photonics Co.,Ltd.

滨松光子滨松光子学株式会社

INFRARED IC INTERNAL INSPECTION SYSTEM

The C2955 is an IC internal inspection system incorporating an infrared microscope and an infrared CCD camera. Use of a newly developed infrared CCD camera enables a high sensitivity approximately ten times that of conventional systems (in comparisons by HAMAMATSU), at a wavelength of 1.0 µm, making

Hamamatsu

滨松光子

COMPLEMENTARY SILICON POWER TRANSISTOR

DESCRIPTION: The CENTRAL SEMICONDUCTOR CJD2955 and CJD3055 are complementary silicon power transistors manufactured by the epitaxial base process, mounted in a surface mount package, and designed for high current amplifier and switching applications. MARKING: FULL PART NUMBER

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CENTRAL

SURFACE MOUNT COMPLEMENTARY SILICON POWER TRANSISTORS

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CENTRAL

silicon power transistors

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CENTRAL