丝印：AHC08；Package：WQFN；SNx4AHC08 Quadruple 2-Input Positive-AND Gates

1 Features • 2-V to 5.5-V Operating Range • Latch-Up Performance Exceeds 250 mA Per JESD 17 • ESD Protection Exceeds JESD 22 2 Applications • Servers • Network Switches • PCs and Notebooks • Electronic Points of Sale 3 Description The SNx4AHC08 devices are quadruple 2-input positiv

文件：2.61261 Mbytes 页数：39 Pages

TI

德州仪器

丝印：AHC08；Package：SOIC；SNx4AHC08 Quadruple 2-Input Positive-AND Gates

1 Features • 2-V to 5.5-V Operating Range • Latch-Up Performance Exceeds 250 mA Per JESD 17 • ESD Protection Exceeds JESD 22 2 Applications • Servers • Network Switches • PCs and Notebooks • Electronic Points of Sale 3 Description The SNx4AHC08 devices are quadruple 2-input positiv

文件：2.61261 Mbytes 页数：39 Pages

TI

德州仪器

丝印：AHC08；Package：SOIC；SNx4AHC08 Quadruple 2-Input Positive-AND Gates

1 Features • 2-V to 5.5-V Operating Range • Latch-Up Performance Exceeds 250 mA Per JESD 17 • ESD Protection Exceeds JESD 22 2 Applications • Servers • Network Switches • PCs and Notebooks • Electronic Points of Sale 3 Description The SNx4AHC08 devices are quadruple 2-input positiv

文件：2.61261 Mbytes 页数：39 Pages

TI

德州仪器

丝印：AHC08；Package：SO；SNx4AHC08 Quadruple 2-Input Positive-AND Gates

1 Features • 2-V to 5.5-V Operating Range • Latch-Up Performance Exceeds 250 mA Per JESD 17 • ESD Protection Exceeds JESD 22 2 Applications • Servers • Network Switches • PCs and Notebooks • Electronic Points of Sale 3 Description The SNx4AHC08 devices are quadruple 2-input positiv

文件：2.61261 Mbytes 页数：39 Pages

TI

德州仪器

丝印：AHC08MEP；Package：SOIC；QUADRUPLE 2-INPUT POSITIVE-AND GATE

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Operating Range 2-V to 5.5-V VCC EPIC (Enhanced-Perf

文件：210.22 Kbytes 页数：10 Pages

TI

德州仪器

丝印：AHC08MEP；Package：SOIC；QUADRUPLE 2-INPUT POSITIVE-AND GATE

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Operating Range 2-V to 5.5-V VCC EPIC (Enhanced-Perf

文件：210.22 Kbytes 页数：10 Pages

TI

德州仪器

丝印：AHC08EP；Package：TSSOP；QUADRUPLE 2-INPUT POSITIVE-AND GATE

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† Operating Range 2-V to 5.5-V VCC EPIC (Enhanced-Perf

文件：210.22 Kbytes 页数：10 Pages

TI

德州仪器

丝印：AHC08Q；Package：SOIC；SN74AHC08Q-Q1 Automotive Quadruple 2-Input Positive-and Gate

1 Features • Qualified for Automotive Applications • Operating Range 2-V to 5.5-V VCC • EPIC™ (Enhanced-Performance Implanted CMOS) Process • Latch-Up Performance Exceeds 250 mA Per JESD 17 2 Description This device is a quadruple 2-input positive-AND gate that performs the Boolean func

文件：1.44212 Mbytes 页数：21 Pages

TI

德州仪器

丝印：AHC08Q；Package：SOIC；SN74AHC08Q-Q1 Automotive Quadruple 2-Input Positive-and Gate

1 Features • Qualified for Automotive Applications • Operating Range 2-V to 5.5-V VCC • EPIC™ (Enhanced-Performance Implanted CMOS) Process • Latch-Up Performance Exceeds 250 mA Per JESD 17 2 Description This device is a quadruple 2-input positive-AND gate that performs the Boolean func

文件：1.44212 Mbytes 页数：21 Pages

TI

德州仪器

丝印：AHC08Q；Package：WQFN；SN74AHC08Q-Q1 Automotive Quadruple 2-Input Positive-and Gate

1 Features • Qualified for Automotive Applications • Operating Range 2-V to 5.5-V VCC • EPIC™ (Enhanced-Performance Implanted CMOS) Process • Latch-Up Performance Exceeds 250 mA Per JESD 17 2 Description This device is a quadruple 2-input positive-AND gate that performs the Boolean func

文件：1.44212 Mbytes 页数：21 Pages

TI

德州仪器