ADR4525集成电路（IC）的电压基准规格书PDF中文资料

ADR4525属于集成电路（IC）的电压基准。由亚德诺半导体技术有限公司制造生产的ADR4525电压基准产品属于基准电压源系列，可通过相对较不稳定的电源提供稳定的电势，电压值始终保持恒定，以便在测量、控制和类似应用中用作比较的标准。其功能行为可能与用于大功率调节的线性稳压器相似，但基准电压源器件却不适合用于此类用途。用作比较标准时，若输出电流容量或实际负载电流增大，其性能通常会降低。

GENERAL DESCRIPTION

The AD3541R is a low drift, single channel, ultra-fast, 16-bit accuracy,

voltage output digital-to-analog converter (DAC) that can be

configured in multiple voltage span ranges. The AD3541R operates

with a fixed 2.5 V reference.

The device incorporates three drift compensating feedback resistors

for the internal transimpedance amplifier (TIA) that scales the

output voltage. The AD3541R has five preconfigured output ranges:

0 V to 2.5 V, 0 V to 5 V, 0 V to 10 V, −5 V to +5 V, and −2.5 V to

+7.5 V.

The DAC can operate in fast mode for maximum speed or precision

mode for maximum accuracy.

The serial peripheral interface (SPI) can be configured in single SPI

(classic SPI) mode or dual SPI mode with single date rate (SDR) or

double data rate (DDR), with logical levels from 1.2 V to 1.8 V.

To improve device robustness, cyclic redundancy check (CRC) can

be enabled. Multiple error checkers have also been integrated to

detect VREF failures or memory map corruption.

The AD3541R is specified over the extended industrial temperature

range (–40°C to +105°C).

FEATURES

► 16-bit resolution

► 16 MUPS single channel rate in fast mode

► 11 MUPS single channel rate in precision mode

► 78 ns small signal settling time to 0.1 accuracy

► 100 ns large signal settling time to 0.1 accuracy

► Ultrasmall glitch: <50 pV×s

► Ultralow latency: 5 ns

► THD: −105 dB at 1 kHz

► Highly configurable output voltage span and offset

► 1.2 V and 1.8 V logic level compatible

► Single (classic) and dual SPI modes

► Multiple error detectors, both analog and digital domains

► 2.5 V internal voltage reference, 10 ppm/°C maximum temperature coefficient

► Small package: 4 mm × 4 mm LFCSP

APPLICATIONS

► Instrumentation

► Hardware in the loop

► Process control equipment

► Medical devices

► Automated test equipment

► Data acquisition system

► Programmable voltage sources

► Optical communications