ADA4941开发板套件编程器的评估板-运算放大器规格书PDF中文资料

ADA4941属于开发板套件编程器的评估板-运算放大器。由亚德诺半导体技术有限公司制造生产的ADA4941评估板 - 运算放大器运算放大器评估板是装有元器件的电路，用于提供特定集成电路或器件的工作实例。该产品族中的电路板提供了运算放大器实例。每个 IC 的通道类型有单通道、双通道、三通道、四通道和八通道，放大器类型包括音频、自动归零、缓冲器、斩波器、电流反馈、电流检测、差动、差分、四通道、仪表、隔离、J-FET、限幅、对数、功率、可编程增益、采样保持、跨阻、可变增益、视频、电压反馈和零漂移。

GENERAL DESCRIPTION

The AD7903 is a dual 16-bit, successive approximation, analog to-digital converter (ADC) that operates from a single power supply, VDDx, per ADC. It contains two low power, high speed, 16-bit sampling ADCs and a versatile serial port interface (SPI). On the CNVx rising edge, the AD7903 samples the voltage difference between the INx+ and INx− pins. The voltages on these pins usually swing in opposite phases between 0 V and VREF. The externally applied reference voltage of the REFx pins (VREF) can be set independently from the supply voltage pins, VDDx. The power of the device scales linearly with throughput.

Using the SDIx inputs, the SPI-compatible serial interface can also daisy-chain multiple ADCs on a single 3-wire bus and provide an optional busy indicator. It is compatible with 1.8 V, 2.5 V, 3 V, or 5 V logic, using the separate VIOx supplies.

The AD7903 is available in a 20-lead QSOP package with operation specified from −40°C to +125°C.

FEATURES

16-bit resolution with no missing codes

Throughput: 1 MSPS

Low power dissipation

7.0 mW at 1 MSPS (VDD1 and VDD2 only)

12.0 mW at 1 MSPS (total)

140 µW at 10 kSPS

INL: ±0.5 LSB typical, ±2.0 LSB maximum

SINAD: 93.5 dB at 1 kHz

THD: −112 dB at 1 kHz

True differential analog input range: ±VREF

0 V to VREF with VREF between 2.4 V to 5.1 V

Allows use of any input range

Easy to drive with the ADA4941-1

No pipeline delay

Single-supply 2.5 V operation with 1.8 V/2.5 V/3 V/5 V logic

interface

Serial port interface (SPI)/QSPI/MICROWIRE/DSP compatible

20-lead QSOP package

Wide operating temperature range: −40°C to +125°C

APPLICATIONS

Battery-powered equipment

Communications

Automated test equipment (ATE)

Data acquisition

Medical instrumentation

Redundant measurement

Simultaneous sampling