28C256TRT2DB-12中文资料Maxwell数据手册PDF规格书

DESCRIPTION:

Maxwell Technologies’ 28C256T high density 256k-bit EEPROM microcircuit features a greater than 100 krad (Si) total dose tolerance, depending upon space mission. The 28C256T is capable of in-system electrical byte and page programmability. It has a 64-Byte page programming function to make its erase and write operations faster. It also features data polling to indicate the completion of erase and program ming operations.

FEATURES:

• RAD-PAK® radiation-hardened against natural space radiation

• Total dose hardness:

- > 100 Krad (Si), dependent upon space mission

• Excellent Single Event Effects:

- SELTH LET: > 120 MeV/mg/cm2

- SEUTH LET (read mode): > 90 MeV/mg/cm2

- SEUTH LET (write mode): > 18 MeV/mg/cm2

• Package:

- 28 pin RAD-PAK® flat pack

- 28 pin RAD-PAK® DIP

- JEDEC approved byte wide pinout

• High Speed:

- 120, 150 ns maximum access times available

• High endurance:

- 10,000 erase/write (in Page Mode), 10-year data retention

• Page Write Mode:

- 1 to 64 bytes

• Low power dissipation:

- 15 mA active current (cycle = 1 µs)

- 20 µA standby current (CE = VCC)