首页 >TC9491AJ>规格书列表
| 零件编号 | 下载 订购 | 功能描述/丝印 | 制造商 上传企业 | LOGO |
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LOWPOWER,BANDGAPVOLTAGEREFERENCES GENERALDESCRIPTION TheTC9491(1.220Voutput)bipolar,two-terminal,bandgapvoltagereferencesofferprecisionperformancewithoutpremiumprice.Thesedevicesdonotrequirethinfilmresistors,greatlyloweringmanufacturingcomplexityandcost. A50ppm/°Coutputtemperaturecoefficientanda | TELCOM TelCom Semiconductor, Inc | TELCOM | ||
LOWPOWER,BANDGAPVOLTAGEREFERENCES GENERALDESCRIPTION TheTC9491(1.220Voutput)bipolar,two-terminal,bandgapvoltagereferencesofferprecisionperformancewithoutpremiumprice.Thesedevicesdonotrequirethinfilmresistors,greatlyloweringmanufacturingcomplexityandcost. A50ppm/°Coutputtemperaturecoefficientanda | TELCOM TelCom Semiconductor, Inc | TELCOM | ||
LOWPOWER,BANDGAPVOLTAGEREFERENCES GENERALDESCRIPTION TheTC9491(1.220Voutput)bipolar,two-terminal,bandgapvoltagereferencesofferprecisionperformancewithoutpremiumprice.Thesedevicesdonotrequirethinfilmresistors,greatlyloweringmanufacturingcomplexityandcost. A50ppm/°Coutputtemperaturecoefficientanda | TELCOM TelCom Semiconductor, Inc | TELCOM | ||
THVD9491-SEPRadiationTolerant3Vto5.5VRS-485TransceiverwithFlexibleI/OSupplyandIECESDProtection 1Features •VIDV62/24626 •MeetsorexceedstherequirementsoftheTIA/ EIA-485AandTIA/EIA-422Bstandards •Totalionizingdose(TID)characterizedupto 30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30krad (Si) •Single-eventef | TITexas Instruments 德州仪器美国德州仪器公司 | TI | ||
THVD9491-SEPRadiationTolerant3Vto5.5VRS-485TransceiverwithFlexibleI/OSupplyandIECESDProtection 1Features •VIDV62/24626 •MeetsorexceedstherequirementsoftheTIA/ EIA-485AandTIA/EIA-422Bstandards •Totalionizingdose(TID)characterizedupto 30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30krad (Si) •Single-eventef | TITexas Instruments 德州仪器美国德州仪器公司 | TI | ||
THVD9491-SEPRadiationTolerant3Vto5.5VRS-485TransceiverwithFlexibleI/OSupplyandIECESDProtection 1Features •MeetsorexceedstherequirementsoftheTIA/ EIA-485AandTIA/EIA-422Bstandards •Totalionizingdose(TID)characterizedupto 30krad(Si) –Totalionizingdoseradiationlotacceptance testing(TIDRLAT)foreverywaferlotto30krad (Si) •Single-eventeffects(SEE)chara | TI1Texas Instruments 德州仪器美国德州仪器公司 | TI1 |
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