SN74LVC132APWRQ1中文资料德州仪器数据手册PDF规格书

厂商型号	SN74LVC132APWRQ1
功能描述	SN74LVC132A-Q1 Automotive Quadruple 2-Input NAND Gates with Schmitt-Trigger Inputs
丝印标识	LVC132Q
封装外壳	TSSOP
文件大小	1.58275 Mbytes
页面数量	26 页
生产厂商	Texas Instruments
企业简称	TI1【德州仪器】
中文名称	美国德州仪器公司官网
原厂标识
数据手册	下载地址一下载地址二到原厂下载
更新时间	2025-8-3 10:46:00
人工找货	SN74LVC132APWRQ1价格和库存，欢迎联系客服免费人工找货

1 Features

• AEC-Q100 qualified for automotive applications:

– Device temperature grade 1: -40°C to +125°C

– Device HBM ESD classification level 2

– Device CDM ESD classification level C4B

• Available in wettable flank QFN (WBQA) package

• Operating range from 1.1V to 3.6V

• 5.5V tolerant input pins

• Supports standard pinouts

• Latch-up performance exceeds 250mA

per JESD 17

• ESD protection exceeds JESD 22

– 2000V Human-Body Model (A114-A)

– 1000V Charged-Device Model (C101)

2 Applications

• Combining power good signals

• Enable digital signals

3 Description

The SN74LVC132A-Q1 device is a quadruple

positive-NAND gate with Schmitt-trigger inputs for

added noise immunity and support for slow input

signal transitions. Each gate performs the Boolean

function Y = A × B or Y = A + B in positive logic.