SN74LV4T00-Q1中文资料德州仪器数据手册PDF规格书

1 Features

• AEC-Q100 qualified for automotive applications:

– Device temperature grade 1: -40°C to +125°C

– Device HBM ESD classification level 2

– Device CDM ESD classification level C4B

• Available in wettable flank QFN (WBQA) package

• Wide operating range of 1.8 V to 5.5 V

• Single-supply voltage translator (refer to LVxT

Enhanced Input Voltage):

– Up translation:

• 1.2 V to 1.8 V

• 1.5 V to 2.5 V

• 1.8 V to 3.3 V

• 3.3 V to 5.0 V

– Down translation:

• 5.0 V, 3.3 V, 2.5 V to 1.8 V

• 5.0 V, 3.3 V to 2.5 V

• 5.0 V to 3.3 V

• 5.5-V tolerant input pins

• Supports standard pinouts

• Up to 150 Mbps with 5-V or 3.3-V VCC

• Latch-up performance exceeds 250 mA per JESD

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2 Applications

• Enable or disable a digital signal

• Controlling an indicator LED

• Translation between communication modules and

system controllers

3 Description

The SN74LV4T00-Q1 contains four independent 2-

input NAND Gates with Schmitt-trigger inputs. Each

gate performs the Boolean function Y = A ● B in

positive logic. The output level is referenced to the

supply voltage (VCC) and supports 1.8-V, 2.5-V, 3.3-V,

and 5-V CMOS levels.

The input is designed with a lower threshold circuit to

support up translation for lower voltage CMOS inputs

(for example, 1.2 V input to 1.8 V output or 1.8 V input

to 3.3 V output). In addition, the 5-V tolerant input pins

enable down translation (for example, 3.3 V to 2.5 V

output).