SN54SC245-SEP_V01中文资料德州仪器数据手册PDF规格书

1 Features

• Vendor item drawing available, VID V62/23616

• Total ionizing dose characterized at 30 krad(Si)

– Total ionizing dose characterized radiation lot

acceptance testing (TID RLAT) for every wafer

lot to 30 krad(Si)

• Single-event effects (SEE) characterized:

– Single event latch-up (SEL) immune to linear

energy transfer (LET) = 43 MeV-cm2 /mg

– Single event transient (SET) characterized to

43 MeV-cm2 /mg

• Wide operating range of 1.2 V to 5.5 V

• 5.5 V tolerant input pins

• Output drive up to 25 mA at 5-V

• Latch-up performance exceeds 250 mA per

JESD 17

• Space enhanced plastic (SEP)

– Controlled baseline

– Gold bondwire

– NiPdAu lead finish

– One assembly and test site

– One fabrication site

– Military (–55°C to 125°C) temperature range

– Extended product life cycle

– Product traceability

– Meets NASAs ASTM E595 outgassing

specification

2 Applications

• Enable or Disable a Digital Signal

• Eliminate Slow or Noisy Input Signals

• Hold a Signal During Controller Reset

• Debounce a Switch

3 Description

SN54SC245-SEP is an octal bus transceiver with 3-

state outputs. All eight channels are controlled by

the direction (DIR) pin and output enable (OE) pin.

The output enable (OE) controls all outputs in the

device. When the OE pin is in the low state, the

appropriate outputs as determined by the direction

(DIR) pin are enabled. When the OE pin is in the

high state, all outputs of the device are disabled. All

disabled outputs are placed into the high-impedance

state.