INA745B-Q1中文资料德州仪器数据手册PDF规格书

1 Features

• AEC-Q100 qualified for automotive applications:

– Temperature grade 1: –40°C to +125°C, TA

• Functional Safety-Capable

– Documentation available to aid functional safety

system design

• Low loss integrated shunt resistor

– Internal resistance: 800μΩ, TA = 25°C

– Continuous current: ±35A, TA = 25°C

– Peak measurement capability: ±39.32A

• Current monitoring accuracy: A/B Grade,

maximum

– Offset current: ±6.25mA / ±62.5mA

– Offset drift: ±30μA/°C (A and B Grades)

– System gain error: ±0.75% / ±1.25%

– Common-mode rejection: ±0.125 / ±1.25mA/V

• Power monitoring accuracy: A/B Grade, maximum

– ±0.9% / ±1.6% at 25°C, full scale

• Energy and charge accuracy: A/B Grade,

maximum

– ±1.4% / ±2.1% at 25°C, full scale

• Temperature sensor: ±1.5°C (maximum at 25°C)

• Precision oscillator: ±0.5% (maximum at 25°C)

• Programmable conversion time and averaging

• 2.94MHz high-speed I2C interface with 16 pinselectable

addresses

• Operates from a 2.7V to 5.5V supply:

– Operational current: 640μA (typical)

– Shutdown current: 5μA (maximum)

2 Applications

• ADAS domain controllers

• Autonomous driving module

• Head unit and digital cockpit

• Telematics control unit

3 Description

The INA745x-Q1 is a digital power monitor with an

integrated current sensing element along with a 16-

bit delta-sigma ADC specifically designed for currentsensing

applications. The device can measure fullscale

currents up to ±39.32A with common-mode

voltage support from –0.1V to +40V.

The INA745x-Q1 reports current, bus voltage, die

temperature, power, energy and charge accumulation

while employing a precision ±0.5% integrated

oscillator, all while performing the needed calculations

in the background. The integrated temperature sensor

is ±2.5°C accurate over the junction temperature

range.

The low offset and gain drift design of the INA745x-

Q1 allows the device to be used in precise systems

that do not undergo multi-temperature calibration

during manufacturing.

The device allows for selectable ADC conversion

times from 50μs to 4.12ms as well as sample

averaging from 1x to 1024x, which further helps

reduce the noise of the measured data.