EVM4287AHFT中文资料升特数据手册PDF规格书

Description

E42X7 is a family of Dual Channel Parametric Measurement Units (PMU) designed for automated test equipment and instrumentation. Manufactured in a wide voltage Bi-CMOS process, it is a monolithic solution for a

per-pin PMU.

The E42X7 family consists of three products:

E4287

• 16.25V I/O range

• 4 current ranges up to ± 40 mA

• Analog mux for providing a FLASHTM programming level

• Driven guard pin

E4257

• 16.25V I/O range

• 4 Current ranges up to ± 40 mA

• Small 9mm x 9mm footprint

E4237

• 16.25VI/O range

• 2 current ranges up to ± 4 mA

• Low capacitance for use in relayless tester architectures

Features

• Four Quadrant Operation (FV/MI, FV/MV, FI/MV, FI/MI)

• 4 Current Ranges (± 40 µA, ± 400 µA, ± 4 mA, ± 40 mA) (E4287, E4257)

• 2 Current Ranges (± 40 µA and ± 4 mA) (E4237)

• Wide Output Voltage Range

– –3.25V to +13V @ RF pin across all ranges

– –3.25V to ± 13V @ FORCE Pin (Ranges A, B, C)

– –1.25V to +11V @ FORCE (Range D)

• Low Power Dissipation

• FV Linearity to ± 0.025 FSVR

• Extremely Fast Settling Times offer reduced test times/increased tester thru-put.

• Central PMU Switches for External PMU,

–4.75 V to +14.5V, ± 40 mA Ranges

• Switches for Pin Driver Super Voltages

• Driven Guard Output (E4287)

• Test Head Ground Reference

• Stable with up to 300 pF Capacitive Loading with no external compensation capacitors

• Switchable Compensation allows stability with up to 10 nF Capacitive Loading

• 14x14 mm, 80 Pin MQFP Package (E4287)

• Small, 9x9 mm, 64-Pad LPCC Package (E4237, E4257)

Applications

• Automated Test Equipment

– Memory Testers

– Logic Testers

– Mixed Signal Testers

– SOC Testers

• Instrumentation