EBE21FD4AHFE-6E-E中文资料美光科技数据手册PDF规格书

Features

• JEDEC standard Raw Card E Design

• Industry Standard Advanced Memory Buffer (AMB)

• High-speed differential point-to-point link interface at 1.5V (JEDEC draft spec)

- 14 north-bound (NB) high speed serial lanes

- 10 south-bound (SB) high speed serial lanes

• Various features/modes:

- MemBIST and IBIST test functions

- Transparent mode and direct access mode for DRAM testing

- Interface for a thermal sensor and status indicator

• Channel error detection and reporting

• Automatic DDR2 SDRAM bus and channel calibration

• SPD (serial presence detect) with 1piece of 256 byte serial EEPROM